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Third IEEE International Workshop on Electronic Design, Test, and Applications: Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
National Instruments
Hardcover. IEEE Computer Society Press 2006-01-28.
ISBN 9780769525006
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Third IEEE International Workshop on Electronic Design, Test, and Applications: Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
Book reviews » Third IEEE International Workshop on Electronic Design, Test, and Applications: Proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
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